The article describes a control test generation method for discrete devices based on the genetic algorithm. The method operability and effectiveness have been checked by means of creating tests for circuits listed in the ISCAS’ 89 catalogue. The C++( Visual Studio 2005) program has been implemented in order to simulate circuit and generate tests. Faults are simulated by programmatically setting an appropriate object in storage to a special state, in which it acts as a faulty component.